Results for:
Bruce W. Smith
Bruce W. Smith
Engineering
Rochester,, New York
If you're not satisfied, we don't expect you to pay.
That's our commitment and your guarantee. Simply ask for a refund.
Disclaimer
We are an independent data provider, compiling expert witness information from court websites, public records, and third-party sources. We do not employ, endorse, or have any affiliation with the experts profiled. This page is not a means to contact the expert directly.
Expert Details
Dr. Bruce W. Smith, Ph.D. is a microelectronic engineering expert witness from New York. He
earned his B.S. in 1986, his M.S. in 1989 and then earned his Ph.D. in 1995 from Rochester
Institute of Technology.
Currently, Dr. Smith is the Director and Professor of Microsystems Engineering Ph.D. Program at Kate Gleason College of Engineering at Rochester Institute of Technology. Prior to this, he was the Intel Professor of Research and Technology, the Associate Dean of Graduate Programs and Director at Rochester Institute of Technology. Further before that, he was the Professor at IMEC (lnteruniversity Microelectronics Center).
He has additional knowledge in semiconductor IC processes and fabrication, microlithography,
deposition and etching processes and TFT/LCD flat panel technology.
A previous Expert Challenge Study on Bruce W. Smith revealed:
| Total Challenges | 1 |
|---|---|
| Direct Challenges | 1 |
| Indirect Challenges | 0 |
The Preliminary Screening Report (PSR) gives you both a snapshot of an expert’s testimonial history and an accurate assessment of how prolific a testifier that expert has been in the past. Most importantly, it is a tool to help you determine if there is enough information available regarding the expert to justify the investment in a full Expert Witness Profile.
Read More
Learn about cases where an expert has been challenged under Daubert or their testimony has been criticized by the judge or the opposing party. See the grounds for such challenges, their outcomes (where available) and citations to underlying documents. The Challenge Study includes direct challenges to experts as well as instances where the expert’s testimony/ affidavit was submitted in support or against a motion.
Read More
The Expert Witness Profile is the most comprehensive and cost-effective background report on an expert witness in the United States today. The product is used by lawyers, law librarians and paralegals practicing in every area of law and by the widest array of organizations: from AMLAW 100 law firms to sole practitioners to national associations of attorneys to expert search firms and even by expert witnesses themselves.